TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_58_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-022-15 | FUSED_ID : 6359364768399159663
  IC_TEMP :  -52.34 | VDDM : 1138.69 | AUX_INT :   -3.33 | CsaBias :   81.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.00486e-04 / 2
  ADC_P0  : -3.32808e-03 ± 1.65827e-02
  ADC_P1  : 7.79336e-03 ± 3.91490e-04
  ADC_P2  : -4.59182e-06 ± 1.81520e-06
  CSA_Chi2/NDF : 7.70463e-05 / 2
  CSA_P0  : 6.00669e-02 ± 5.85461e-03
  CSA_P1  : 9.38887e-03 ± 4.41103e-04
  CSA_P2  : -3.66562e-05 ± 6.71747e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [64, 95, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [4, 18, 35, 76, 78, 96, 98, 104, 113, 118, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4098', '1.800', '0.1734', '1.800', '0.0990', '7.000', '0.7090', 1, 1, 1, 1, 1726149481.989962]
VI_after__Init : ['1.202', '0.4099', '1.800', '0.1733', '1.800', '0.0915', '7.000', '0.7079', 1, 1, 1, 1, 1726149490.2233264]
VI_at__the_End : ['1.202', '0.5030', '1.800', '0.1359', '1.800', '0.1100', '7.000', '0.7087', 1, 1, 1, 1, 1726149558.0150793]