TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_56_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-023-15 | FUSED_ID : 6359364768399159679
  IC_TEMP :  -50.39 | VDDM : 1129.68 | AUX_INT :   -7.00 | CsaBias :  102.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25348e-03 / 2
  ADC_P0  : -7.00076e-03 ± 2.40411e-02
  ADC_P1  : 7.89758e-03 ± 5.69136e-04
  ADC_P2  : -4.45204e-06 ± 2.67796e-06
  CSA_Chi2/NDF : 1.10112e-04 / 2
  CSA_P0  : 5.86500e-02 ± 6.99907e-03
  CSA_P1  : 9.75329e-03 ± 5.27330e-04
  CSA_P2  : -4.10463e-05 ± 8.03061e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [6, 53, 99, 118, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [5, 74, 103, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3832', '1.800', '0.1222', '1.800', '0.0953', '7.000', '0.7077', 1, 1, 1, 1, 1726149384.8154094]
VI_after__Init : ['1.201', '0.3832', '1.800', '0.1222', '1.802', '0.0896', '7.000', '0.7079', 1, 1, 1, 1, 1726149392.9827993]
VI_at__the_End : ['1.202', '0.5084', '1.800', '0.1398', '1.800', '0.1095', '7.000', '0.7091', 1, 1, 1, 1, 1726149462.6913702]