TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_32_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-016-008-00 | FUSED_ID : 6359364768399163520
  IC_TEMP :  -54.12 | VDDM : 1125.05 | AUX_INT :   -9.91 | CsaBias :   74.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64649e-03 / 2
  ADC_P0  : -9.90514e-03 ± 2.74942e-02
  ADC_P1  : 8.53457e-03 ± 6.74984e-04
  ADC_P2  : -6.45451e-06 ± 3.29140e-06
  CSA_Chi2/NDF : 1.70413e-04 / 2
  CSA_P0  : 5.84348e-02 ± 8.70710e-03
  CSA_P1  : 1.00141e-02 ± 6.56017e-04
  CSA_P2  : -4.58384e-05 ± 9.99037e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [6, 35, 52, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [3, 36, 48, 72, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1766', '1.800', '0.2122', '1.800', '0.0887', '7.000', '0.7070', 1, 1, 1, 1, 1726151523.3937867]
VI_after__Init : ['1.202', '0.1766', '1.800', '0.2121', '1.800', '0.0830', '7.000', '0.7072', 1, 1, 1, 1, 1726151531.5491047]
VI_at__the_End : ['1.201', '0.5051', '1.800', '0.1391', '1.800', '0.1113', '7.000', '0.7083', 1, 1, 1, 1, 1726151595.7332883]