TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_33_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-016-009-00 | FUSED_ID : 6359364768399163536
  IC_TEMP :  -56.81 | VDDM : 1117.42 | AUX_INT :  -10.40 | CsaBias :   71.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.80619e-03 / 2
  ADC_P0  : -1.03987e-02 ± 2.88278e-02
  ADC_P1  : 8.25049e-03 ± 6.87653e-04
  ADC_P2  : -5.74610e-06 ± 3.26979e-06
  CSA_Chi2/NDF : 1.58872e-04 / 2
  CSA_P0  : 6.02507e-02 ± 8.40709e-03
  CSA_P1  : 9.96097e-03 ± 6.33413e-04
  CSA_P2  : -4.81328e-05 ± 9.64614e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [8, 13, 27, 81, 94, 95, 97, 101, 104, 107, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [8, 11, 12, 30, 34, 57, 64, 76, 92, 96, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2446', '1.800', '0.1561', '1.800', '0.0883', '7.000', '0.7072', 1, 1, 1, 1, 1726151619.420592]
VI_after__Init : ['1.202', '0.2447', '1.800', '0.1561', '1.800', '0.0825', '7.000', '0.7072', 1, 1, 1, 1, 1726151628.2268136]
VI_at__the_End : ['1.202', '0.4924', '1.800', '0.1394', '1.807', '0.1140', '7.000', '0.7083', 1, 1, 1, 1, 1726151693.9829226]