TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_35_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-016-010-00 | FUSED_ID : 6359364768399163552
  IC_TEMP :  -55.36 | VDDM : 1112.78 | AUX_INT :   -6.26 | CsaBias :   67.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.34170e-04 / 2
  ADC_P0  : -6.26496e-03 ± 1.82424e-02
  ADC_P1  : 8.27405e-03 ± 4.31977e-04
  ADC_P2  : -6.54223e-06 ± 2.01986e-06
  CSA_Chi2/NDF : 1.58251e-04 / 2
  CSA_P0  : 5.88230e-02 ± 8.39064e-03
  CSA_P1  : 9.90631e-03 ± 6.32174e-04
  CSA_P2  : -4.57061e-05 ± 9.62727e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [6, 42, 84, 89, 99, 112, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [10, 22, 49, 68, 104, 106, 123, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3676', '1.800', '0.1178', '1.800', '0.0919', '7.000', '0.7074', 1, 1, 1, 1, 1726151716.9991431]
VI_after__Init : ['1.202', '0.3676', '1.800', '0.1178', '1.800', '0.0865', '7.000', '0.7072', 1, 1, 1, 1, 1726151725.056649]
VI_at__the_End : ['1.202', '0.4990', '1.800', '0.1384', '1.800', '0.1127', '7.000', '0.7082', 1, 1, 1, 1, 1726151790.988609]