TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_36_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-016-011-00 | FUSED_ID : 6359364768399163568
  IC_TEMP :  -47.24 | VDDM : 1128.33 | AUX_INT :  -17.25 | CsaBias :   73.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35929e-03 / 2
  ADC_P0  : -1.72487e-02 ± 2.53879e-02
  ADC_P1  : 8.32570e-03 ± 6.01624e-04
  ADC_P2  : -6.29646e-06 ± 2.82127e-06
  CSA_Chi2/NDF : 8.41807e-05 / 2
  CSA_P0  : 5.93231e-02 ± 6.11968e-03
  CSA_P1  : 9.30662e-03 ± 4.61074e-04
  CSA_P2  : -3.71465e-05 ± 7.02161e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [19, 63, 73, 76, 86, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [50, 58, 101, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1565', '1.800', '0.1673', '1.800', '0.0843', '7.000', '0.7073', 1, 1, 1, 1, 1726151814.0008552]
VI_after__Init : ['1.202', '0.1565', '1.800', '0.1674', '1.799', '0.0786', '7.000', '0.7078', 1, 1, 1, 1, 1726151822.197263]
VI_at__the_End : ['1.202', '0.4961', '1.800', '0.1366', '1.800', '0.1098', '7.000', '0.7083', 1, 1, 1, 1, 1726151885.5425186]