TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_38_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-016-012-00 | FUSED_ID : 6359364768399163584
  IC_TEMP :  -48.84 | VDDM : 1120.73 | AUX_INT :   -8.03 | CsaBias :   90.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49570e-03 / 2
  ADC_P0  : -8.02856e-03 ± 2.62443e-02
  ADC_P1  : 7.60012e-03 ± 5.86438e-04
  ADC_P2  : -4.60084e-06 ± 2.60463e-06
  CSA_Chi2/NDF : 7.83629e-05 / 2
  CSA_P0  : 5.61077e-02 ± 5.90442e-03
  CSA_P1  : 9.03872e-03 ± 4.44856e-04
  CSA_P2  : -3.54820e-05 ± 6.77463e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [6, 19, 26, 44, 46, 50, 99, 102, 111, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [4, 18, 59, 70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2032', '1.800', '0.1796', '1.800', '0.0866', '7.000', '0.7077', 1, 1, 1, 1, 1726151910.0396626]
VI_after__Init : ['1.202', '0.2031', '1.800', '0.1794', '1.801', '0.0809', '7.000', '0.7076', 1, 1, 1, 1, 1726151918.9449515]
VI_at__the_End : ['1.201', '0.4841', '1.800', '0.1340', '1.799', '0.1103', '7.000', '0.7081', 1, 1, 1, 1, 1726151984.5110261]