TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_41_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-016-014-00 | FUSED_ID : 6359364768399163616
  IC_TEMP :  -49.18 | VDDM : 1133.05 | AUX_INT :   -7.35 | CsaBias :   81.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.50310e-04 / 2
  ADC_P0  : -7.34559e-03 ± 2.08871e-02
  ADC_P1  : 8.12392e-03 ± 5.05999e-04
  ADC_P2  : -4.94528e-06 ± 2.43205e-06
  CSA_Chi2/NDF : 1.02358e-04 / 2
  CSA_P0  : 5.76051e-02 ± 6.74811e-03
  CSA_P1  : 9.83555e-03 ± 5.08422e-04
  CSA_P2  : -4.26292e-05 ± 7.74266e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [4, 32, 41, 53, 95, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [1, 34, 47, 51, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3096', '1.800', '0.1384', '1.800', '0.0950', '7.000', '0.7076', 1, 1, 1, 1, 1726152104.521737]
VI_after__Init : ['1.202', '0.3097', '1.800', '0.1384', '1.800', '0.0897', '7.000', '0.7077', 1, 1, 1, 1, 1726152112.6670148]
VI_at__the_End : ['1.202', '0.5045', '1.800', '0.1366', '1.804', '0.1107', '7.000', '0.7084', 1, 1, 1, 1, 1726152175.4585717]