TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_46_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-016-017-07 | FUSED_ID : 6359364768399163671
  IC_TEMP :  -50.17 | VDDM : 1129.67 | AUX_INT :   -6.57 | CsaBias :   88.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.97305e-04 / 2
  ADC_P0  : -6.57354e-03 ± 1.78228e-02
  ADC_P1  : 7.95158e-03 ± 4.13492e-04
  ADC_P2  : -5.55393e-06 ± 1.89405e-06
  CSA_Chi2/NDF : 6.57089e-05 / 2
  CSA_P0  : 5.99298e-02 ± 5.40673e-03
  CSA_P1  : 9.30817e-03 ± 4.07358e-04
  CSA_P2  : -3.60319e-05 ± 6.20358e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [9, 14, 41, 88]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [20, 49, 54, 86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3042', '1.800', '0.1684', '1.800', '0.0855', '7.000', '0.7077', 1, 1, 1, 1, 1726152395.5729651]
VI_after__Init : ['1.202', '0.3044', '1.800', '0.1684', '1.799', '0.0798', '7.000', '0.7077', 1, 1, 1, 1, 1726152404.3801692]
VI_at__the_End : ['1.201', '0.4987', '1.800', '0.1377', '1.800', '0.1090', '7.000', '0.7086', 1, 1, 1, 1, 1726152472.5354943]