TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_49_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-016-019-07 | FUSED_ID : 6359364768399163703
  IC_TEMP :  -57.11 | VDDM : 1124.92 | AUX_INT :   -9.60 | CsaBias :   70.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60730e-03 / 2
  ADC_P0  : -9.59943e-03 ± 2.72314e-02
  ADC_P1  : 8.00983e-03 ± 6.45474e-04
  ADC_P2  : -4.72619e-06 ± 3.05374e-06
  CSA_Chi2/NDF : 1.39987e-04 / 2
  CSA_P0  : 5.78674e-02 ± 7.89162e-03
  CSA_P1  : 9.80978e-03 ± 5.94577e-04
  CSA_P2  : -4.61131e-05 ± 9.05470e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [31, 51, 53, 56, 57, 58, 76, 78, 90, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 21, 45, 50, 54, 103, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3789', '1.800', '0.1472', '1.800', '0.0928', '7.000', '0.7080', 1, 1, 1, 1, 1726152589.907]
VI_after__Init : ['1.202', '0.3788', '1.800', '0.1473', '1.800', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1726152597.844339]
VI_at__the_End : ['1.202', '0.4865', '1.800', '0.1352', '1.801', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1726152666.4547486]