TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_54_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-016-022-07 | FUSED_ID : 6359364768399163751
  IC_TEMP :  -52.75 | VDDM : 1127.72 | AUX_INT :   -8.36 | CsaBias :   92.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34529e-03 / 2
  ADC_P0  : -8.36291e-03 ± 2.48653e-02
  ADC_P1  : 7.85385e-03 ± 5.70770e-04
  ADC_P2  : -5.19129e-06 ± 2.59529e-06
  CSA_Chi2/NDF : 6.50039e-05 / 2
  CSA_P0  : 5.82286e-02 ± 5.37764e-03
  CSA_P1  : 8.90345e-03 ± 4.05167e-04
  CSA_P2  : -3.29131e-05 ± 6.17021e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [69, 70, 75, 113, 114, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [11, 39, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3942', '1.800', '0.1202', '1.799', '0.0964', '7.000', '0.7079', 1, 1, 1, 1, 1726152880.7725573]
VI_after__Init : ['1.202', '0.3942', '1.800', '0.1199', '1.800', '0.0910', '7.000', '0.7076', 1, 1, 1, 1, 1726152888.8318446]
VI_at__the_End : ['1.202', '0.4848', '1.800', '0.1321', '1.800', '0.1117', '7.000', '0.7086', 1, 1, 1, 1, 1726152948.4670525]