TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_56_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-016-023-07 | FUSED_ID : 6359364768399163767
  IC_TEMP :  -53.83 | VDDM : 1138.49 | AUX_INT :   -7.23 | CsaBias :   95.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.23119e-04 / 2
  ADC_P0  : -7.23139e-03 ± 1.94043e-02
  ADC_P1  : 7.96066e-03 ± 4.56812e-04
  ADC_P2  : -4.99938e-06 ± 2.13356e-06
  CSA_Chi2/NDF : 7.25703e-05 / 2
  CSA_P0  : 6.03454e-02 ± 5.68201e-03
  CSA_P1  : 9.07455e-03 ± 4.28098e-04
  CSA_P2  : -3.28851e-05 ± 6.51943e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 4, 6, 7, 50, 102, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [6, 35, 50]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4146', '1.800', '0.1881', '1.800', '0.0926', '7.000', '0.7081', 1, 1, 1, 1, 1726152978.2367694]
VI_after__Init : ['1.202', '0.4148', '1.800', '0.1881', '1.800', '0.0873', '7.000', '0.7077', 1, 1, 1, 1, 1726152986.3800447]
VI_at__the_End : ['1.202', '0.4992', '1.800', '0.1375', '1.801', '0.1101', '7.000', '0.7087', 1, 1, 1, 1, 1726153048.4501448]