TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_17_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-017-010-13 | FUSED_ID : 6359364768399167661
  IC_TEMP :  -51.58 | VDDM : 1130.82 | AUX_INT :   -7.80 | CsaBias :   88.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04969e-03 / 2
  ADC_P0  : -7.79942e-03 ± 2.19154e-02
  ADC_P1  : 8.05843e-03 ± 5.14391e-04
  ADC_P2  : -5.64355e-06 ± 2.38748e-06
  CSA_Chi2/NDF : 7.65362e-05 / 2
  CSA_P0  : 5.74618e-02 ± 5.83520e-03
  CSA_P1  : 9.58522e-03 ± 4.39640e-04
  CSA_P2  : -3.86414e-05 ± 6.69520e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [68, 102, 109, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [0, 12, 21, 47, 56, 77, 108, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3575', '1.800', '0.1429', '1.800', '0.0901', '7.000', '0.7079', 1, 1, 1, 1, 1726154241.0980222]
VI_after__Init : ['1.202', '0.3579', '1.800', '0.1429', '1.800', '0.0844', '7.000', '0.7080', 1, 1, 1, 1, 1726154249.2245946]
VI_at__the_End : ['1.202', '0.5049', '1.800', '0.1385', '1.800', '0.1108', '7.000', '0.7086', 1, 1, 1, 1, 1726154308.6303241]