TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_12_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-017-013-13 | FUSED_ID : 6359364768399167709
  IC_TEMP :  -52.63 | VDDM : 1121.87 | AUX_INT :   -9.72 | CsaBias :   81.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39880e-03 / 2
  ADC_P0  : -9.71940e-03 ± 2.53033e-02
  ADC_P1  : 8.34734e-03 ± 6.05235e-04
  ADC_P2  : -6.21773e-06 ± 2.88205e-06
  CSA_Chi2/NDF : 1.47225e-04 / 2
  CSA_P0  : 5.82012e-02 ± 8.09305e-03
  CSA_P1  : 1.00313e-02 ± 6.09753e-04
  CSA_P2  : -4.60319e-05 ± 9.28582e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [22, 35, 43, 87, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 7, 8, 12, 89, 90, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4299', '1.800', '0.1429', '1.800', '0.0936', '7.000', '0.7081', 1, 1, 1, 1, 1726153949.7263672]
VI_after__Init : ['1.202', '0.4299', '1.800', '0.1429', '1.800', '0.0880', '7.000', '0.7079', 1, 1, 1, 1, 1726153957.8775866]
VI_at__the_End : ['1.202', '0.5041', '1.800', '0.1411', '1.800', '0.1110', '7.000', '0.7086', 1, 1, 1, 1, 1726154018.7309284]