TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_10_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-017-014-13 | FUSED_ID : 6359364768399167725
  IC_TEMP :  -48.50 | VDDM : 1125.14 | AUX_INT :   -8.70 | CsaBias :   86.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60782e-03 / 2
  ADC_P0  : -8.69958e-03 ± 2.72396e-02
  ADC_P1  : 7.98979e-03 ± 6.44937e-04
  ADC_P2  : -4.89081e-06 ± 3.03179e-06
  CSA_Chi2/NDF : 1.06926e-04 / 2
  CSA_P0  : 5.82708e-02 ± 6.89705e-03
  CSA_P1  : 9.38775e-03 ± 5.19643e-04
  CSA_P2  : -3.82372e-05 ± 7.91354e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [1, 69]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [7, 29, 31, 55, 63, 110, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3572', '1.800', '0.1459', '1.800', '0.0897', '7.000', '0.7079', 1, 1, 1, 1, 1726153852.4239352]
VI_after__Init : ['1.202', '0.3574', '1.800', '0.1459', '1.800', '0.0839', '7.000', '0.7081', 1, 1, 1, 1, 1726153860.6173255]
VI_at__the_End : ['1.201', '0.4916', '1.800', '0.1377', '1.800', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1726153927.9750774]