TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_07_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-017-016-10 | FUSED_ID : 6359364768399167754
  IC_TEMP :  -54.19 | VDDM : 1129.62 | AUX_INT :   -8.35 | CsaBias :   84.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18130e-03 / 2
  ADC_P0  : -8.34587e-03 ± 2.32744e-02
  ADC_P1  : 7.80418e-03 ± 5.31466e-04
  ADC_P2  : -5.04763e-06 ± 2.40825e-06
  CSA_Chi2/NDF : 8.68278e-05 / 2
  CSA_P0  : 5.70327e-02 ± 6.21515e-03
  CSA_P1  : 9.26000e-03 ± 4.68267e-04
  CSA_P2  : -3.73498e-05 ± 7.13115e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [35, 47, 79, 83, 112, 121, 124, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [7, 20, 47, 50, 58, 95, 104, 116, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3939', '1.800', '0.1607', '1.800', '0.0907', '7.000', '0.7078', 1, 1, 1, 1, 1726153657.218237]
VI_after__Init : ['1.202', '0.3941', '1.800', '0.1608', '1.800', '0.0850', '7.000', '0.7080', 1, 1, 1, 1, 1726153665.946506]
VI_at__the_End : ['1.202', '0.4881', '1.800', '0.1330', '1.800', '0.1114', '7.000', '0.7085', 1, 1, 1, 1, 1726153731.4114237]