TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_06_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-017-017-10 | FUSED_ID : 6359364768399167770
  IC_TEMP :  -50.58 | VDDM : 1102.12 | AUX_INT :   -6.49 | CsaBias :   78.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00924e-03 / 2
  ADC_P0  : -6.48774e-03 ± 2.15658e-02
  ADC_P1  : 7.81515e-03 ± 5.09871e-04
  ADC_P2  : -4.27625e-06 ± 2.38596e-06
  CSA_Chi2/NDF : 1.60638e-04 / 2
  CSA_P0  : 5.69332e-02 ± 8.45369e-03
  CSA_P1  : 1.01451e-02 ± 6.36925e-04
  CSA_P2  : -4.80520e-05 ± 9.69961e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [33, 39, 67, 68, 77]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [23, 45, 62, 83, 100, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4455', '1.800', '0.1635', '1.800', '0.0873', '7.000', '0.7079', 1, 1, 1, 1, 1726153560.241785]
VI_after__Init : ['1.202', '0.4453', '1.800', '0.1636', '1.800', '0.0821', '7.000', '0.7079', 1, 1, 1, 1, 1726153568.4771323]
VI_at__the_End : ['1.201', '0.5022', '1.800', '0.1385', '1.800', '0.1100', '7.000', '0.7086', 1, 1, 1, 1, 1726153636.3349113]