TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_04_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-017-018-10 | FUSED_ID : 6359364768399167786
  IC_TEMP :  -54.60 | VDDM : 1104.61 | AUX_INT :   -8.12 | CsaBias :   70.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14244e-03 / 2
  ADC_P0  : -8.11513e-03 ± 2.28958e-02
  ADC_P1  : 7.94514e-03 ± 5.33042e-04
  ADC_P2  : -5.20690e-06 ± 2.46162e-06
  CSA_Chi2/NDF : 1.16938e-04 / 2
  CSA_P0  : 5.83323e-02 ± 7.21273e-03
  CSA_P1  : 9.45164e-03 ± 5.43427e-04
  CSA_P2  : -4.10396e-05 ± 8.27576e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [4, 9, 33, 46, 66]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [2, 29, 33, 35, 46, 68, 118, 119, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2977', '1.800', '0.1023', '1.800', '0.0844', '7.000', '0.7083', 1, 1, 1, 1, 1726153463.5365167]
VI_after__Init : ['1.202', '0.2977', '1.800', '0.1023', '1.800', '0.0790', '7.000', '0.7078', 1, 1, 1, 1, 1726153472.3536801]
VI_at__the_End : ['1.202', '0.4868', '1.800', '0.1380', '1.800', '0.1118', '7.000', '0.7087', 1, 1, 1, 1, 1726153532.708886]