TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_23_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-018-009-03 | FUSED_ID : 6359364768399171731
  IC_TEMP :  -51.50 | VDDM : 1107.19 | AUX_INT :   -8.28 | CsaBias :   83.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23445e-03 / 2
  ADC_P0  : -8.28473e-03 ± 2.38067e-02
  ADC_P1  : 8.41331e-03 ± 5.85581e-04
  ADC_P2  : -5.92085e-06 ± 2.85558e-06
  CSA_Chi2/NDF : 1.20491e-04 / 2
  CSA_P0  : 5.73667e-02 ± 7.32148e-03
  CSA_P1  : 9.62826e-03 ± 5.51621e-04
  CSA_P2  : -4.06894e-05 ± 8.40053e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 22, 28, 103, 105, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [14, 16, 37, 42, 60, 79, 105, 120, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3117', '1.800', '0.1322', '1.800', '0.0924', '7.000', '0.7081', 1, 1, 1, 1, 1726154629.411956]
VI_after__Init : ['1.202', '0.3116', '1.800', '0.1322', '1.800', '0.0866', '7.000', '0.7080', 1, 1, 1, 1, 1726154637.599384]
VI_at__the_End : ['1.202', '0.4997', '1.800', '0.1391', '1.800', '0.1124', '7.000', '0.7087', 1, 1, 1, 1, 1726154697.4078925]