TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_25_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-018-010-03 | FUSED_ID : 6359364768399171747
  IC_TEMP :  -56.09 | VDDM : 1128.25 | AUX_INT :   -6.56 | CsaBias :   78.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.74125e-04 / 2
  ADC_P0  : -6.55976e-03 ± 2.11635e-02
  ADC_P1  : 8.58781e-03 ± 5.44075e-04
  ADC_P2  : -5.58322e-06 ± 2.76479e-06
  CSA_Chi2/NDF : 1.35395e-04 / 2
  CSA_P0  : 6.06906e-02 ± 7.76111e-03
  CSA_P1  : 1.00808e-02 ± 5.84744e-04
  CSA_P2  : -4.59560e-05 ± 8.90496e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [15, 30, 32, 47]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [1, 100, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2400', '1.800', '0.1586', '1.800', '0.0951', '7.000', '0.7090', 1, 1, 1, 1, 1726154726.1427653]
VI_after__Init : ['1.202', '0.2402', '1.800', '0.1587', '1.799', '0.0877', '7.000', '0.7078', 1, 1, 1, 1, 1726154734.880197]
VI_at__the_End : ['1.202', '0.5111', '1.800', '0.1420', '1.800', '0.1122', '7.000', '0.7087', 1, 1, 1, 1, 1726154800.183223]