TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_28_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-018-012-03 | FUSED_ID : 6359364768399171779
  IC_TEMP :  -51.10 | VDDM : 1127.09 | AUX_INT :   -8.03 | CsaBias :   78.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20261e-03 / 2
  ADC_P0  : -8.02537e-03 ± 2.35551e-02
  ADC_P1  : 7.89735e-03 ± 5.59430e-04
  ADC_P2  : -4.25057e-06 ± 2.64668e-06
  CSA_Chi2/NDF : 1.31494e-04 / 2
  CSA_P0  : 5.97367e-02 ± 7.64848e-03
  CSA_P1  : 1.00043e-02 ± 5.76258e-04
  CSA_P2  : -4.51955e-05 ± 8.77573e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [23, 86, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [6, 22, 24, 32, 55, 60, 62, 94, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1897', '1.800', '0.1540', '1.800', '0.0826', '7.000', '0.7080', 1, 1, 1, 1, 1726154921.2101762]
VI_after__Init : ['1.202', '0.1897', '1.800', '0.1540', '1.800', '0.0775', '7.000', '0.7081', 1, 1, 1, 1, 1726154929.3546066]
VI_at__the_End : ['1.202', '0.5094', '1.800', '0.1410', '1.799', '0.1121', '7.000', '0.7089', 1, 1, 1, 1, 1726154997.5173578]