TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_30_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-018-013-03 | FUSED_ID : 6359364768399171795
  IC_TEMP :  -54.52 | VDDM : 1128.93 | AUX_INT :   -6.28 | CsaBias :   57.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.31729e-04 / 2
  ADC_P0  : -6.28299e-03 ± 1.95177e-02
  ADC_P1  : 8.06558e-03 ± 4.70280e-04
  ADC_P2  : -4.78444e-06 ± 2.25217e-06
  CSA_Chi2/NDF : 1.48347e-04 / 2
  CSA_P0  : 6.04389e-02 ± 8.12384e-03
  CSA_P1  : 1.02531e-02 ± 6.12073e-04
  CSA_P2  : -4.87813e-05 ± 9.32115e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [6, 23, 66, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [10, 35, 40, 71, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2714', '1.800', '0.1596', '1.800', '0.0889', '7.000', '0.7081', 1, 1, 1, 1, 1726155019.187776]
VI_after__Init : ['1.202', '0.2716', '1.800', '0.1595', '1.799', '0.0831', '7.000', '0.7079', 1, 1, 1, 1, 1726155027.322187]
VI_at__the_End : ['1.202', '0.5076', '1.800', '0.1406', '1.800', '0.1120', '7.000', '0.7090', 1, 1, 1, 1, 1726155095.379969]