TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_35_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-018-016-04 | FUSED_ID : 6359364768399171844
  IC_TEMP :  -50.59 | VDDM : 1126.27 | AUX_INT :   -7.23 | CsaBias :   78.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08743e-03 / 2
  ADC_P0  : -7.23261e-03 ± 2.23698e-02
  ADC_P1  : 7.85279e-03 ± 5.26170e-04
  ADC_P2  : -4.55254e-06 ± 2.45144e-06
  CSA_Chi2/NDF : 1.24896e-04 / 2
  CSA_P0  : 5.91857e-02 ± 7.45412e-03
  CSA_P1  : 9.96561e-03 ± 5.61614e-04
  CSA_P2  : -4.44142e-05 ± 8.55272e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 11, 13, 102, 104, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [4, 22, 47, 93, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4262', '1.800', '0.1608', '1.800', '0.0898', '7.000', '0.7077', 1, 1, 1, 1, 1726155310.59558]
VI_after__Init : ['1.202', '0.4261', '1.800', '0.1607', '1.799', '0.0838', '7.000', '0.7079', 1, 1, 1, 1, 1726155318.6810718]
VI_at__the_End : ['1.202', '0.5072', '1.800', '0.1405', '1.800', '0.1114', '7.000', '0.7087', 1, 1, 1, 1, 1726155385.001999]