TEST_NAME : Wafer
TEST_DATE : 24_09_13-08_15_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-002-010-14 | FUSED_ID : 6359364768400154798
  IC_TEMP :  -79.02 | VDDM : 1117.45 | AUX_INT :   -9.96 | CsaBias :   70.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54109e-03 / 2
  ADC_P0  : -9.95830e-03 ± 2.65743e-02
  ADC_P1  : 9.02076e-03 ± 6.87267e-04
  ADC_P2  : -7.26899e-06 ± 3.53583e-06
  CSA_Chi2/NDF : 2.28182e-04 / 2
  CSA_P0  : 5.65277e-02 ± 1.00754e-02
  CSA_P1  : 1.02427e-02 ± 7.59109e-04
  CSA_P2  : -5.96752e-05 ± 1.15603e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [3, 11, 17, 20, 27, 40, 64, 77, 78, 85, 91, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [25, 38, 78, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4175', '1.800', '0.1721', '1.800', '0.1029', '7.000', '0.7082', 1, 1, 1, 1, 1726208117.6659846]
VI_after__Init : ['1.201', '0.4178', '1.800', '0.1725', '1.800', '0.0970', '7.000', '0.7076', 1, 1, 1, 1, 1726208125.7934117]
VI_at__the_End : ['1.201', '0.4597', '1.800', '0.1366', '1.800', '0.1227', '7.000', '0.7086', 1, 1, 1, 1, 1726208187.4584785]