TEST_NAME : Wafer
TEST_DATE : 24_09_13-08_21_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-002-014-14 | FUSED_ID : 6359364768400154862
  IC_TEMP :  -64.75 | VDDM : 1116.61 | AUX_INT :   -9.46 | CsaBias :   64.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49523e-03 / 2
  ADC_P0  : -9.46141e-03 ± 2.62193e-02
  ADC_P1  : 8.31363e-03 ± 6.36035e-04
  ADC_P2  : -5.67007e-06 ± 3.07101e-06
  CSA_Chi2/NDF : 2.22051e-04 / 2
  CSA_P0  : 5.68827e-02 ± 9.93914e-03
  CSA_P1  : 1.00699e-02 ± 7.48842e-04
  CSA_P2  : -5.49495e-05 ± 1.14040e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [9, 33, 46, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 22, 37, 58, 111, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4721', '1.800', '0.1203', '1.800', '0.0988', '7.000', '0.7079', 1, 1, 1, 1, 1726208505.2855136]
VI_after__Init : ['1.201', '0.4695', '1.800', '0.1206', '1.800', '0.0937', '7.000', '0.7080', 1, 1, 1, 1, 1726208513.423922]
VI_at__the_End : ['1.202', '0.4665', '1.800', '0.1347', '1.800', '0.1153', '7.000', '0.7087', 1, 1, 1, 1, 1726208581.8714967]