TEST_NAME : Wafer
TEST_DATE : 24_09_13-08_57_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-004-006-11 | FUSED_ID : 6359364768400162923
  IC_TEMP :  -65.38 | VDDM : 1126.58 | AUX_INT :   -5.31 | CsaBias :   64.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.16217e-04 / 2
  ADC_P0  : -5.31187e-03 ± 1.80752e-02
  ADC_P1  : 8.72670e-03 ± 4.61984e-04
  ADC_P2  : -6.67112e-06 ± 2.32684e-06
  CSA_Chi2/NDF : 2.01311e-04 / 2
  CSA_P0  : 5.86156e-02 ± 9.46360e-03
  CSA_P1  : 1.02989e-02 ± 7.13014e-04
  CSA_P2  : -5.22447e-05 ± 1.08584e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [10, 11, 112, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [31, 63, 96, 104, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3582', '1.800', '0.1417', '1.800', '0.1023', '7.000', '0.7080', 1, 1, 1, 1, 1726210644.23539]
VI_after__Init : ['1.202', '0.3583', '1.800', '0.1418', '1.800', '0.0971', '7.000', '0.7082', 1, 1, 1, 1, 1726210652.247826]
VI_at__the_End : ['1.202', '0.4960', '1.800', '0.1412', '1.800', '0.1170', '7.000', '0.7087', 1, 1, 1, 1, 1726210721.205452]