TEST_NAME : Wafer
TEST_DATE : 24_09_13-09_05_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-004-011-11 | FUSED_ID : 6359364768400163003
  IC_TEMP :  -56.68 | VDDM : 1121.18 | AUX_INT :   -6.66 | CsaBias :   76.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.26130e-04 / 2
  ADC_P0  : -6.65871e-03 ± 2.05515e-02
  ADC_P1  : 8.34528e-03 ± 4.95149e-04
  ADC_P2  : -6.36459e-06 ± 2.35747e-06
  CSA_Chi2/NDF : 1.34723e-04 / 2
  CSA_P0  : 5.84444e-02 ± 7.74183e-03
  CSA_P1  : 9.70648e-03 ± 5.83291e-04
  CSA_P2  : -4.41086e-05 ± 8.88284e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 35, 56, 80, 102]
 | N_BROKEN_SLOW :  [39]
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [23, 69, 115]
 | P_BROKEN_SLOW :  [39]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2888', '1.800', '0.1742', '1.800', '0.0883', '7.000', '0.7078', 1, 1, 1, 1, 1726211130.4491534]
VI_after__Init : ['1.202', '0.2888', '1.800', '0.1742', '1.800', '0.0825', '7.000', '0.7079', 1, 1, 1, 1, 1726211138.669516]
VI_at__the_End : ['1.202', '0.4893', '1.800', '0.1398', '1.800', '0.1141', '7.000', '0.7087', 1, 1, 1, 1, 1726211198.518868]