TEST_NAME : Wafer
TEST_DATE : 24_09_13-09_11_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-004-015-11 | FUSED_ID : 6359364768400163067
  IC_TEMP :  -55.39 | VDDM : 1112.86 | AUX_INT :   -7.05 | CsaBias :   74.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15188e-03 / 2
  ADC_P0  : -7.05352e-03 ± 2.30128e-02
  ADC_P1  : 8.18928e-03 ± 5.59358e-04
  ADC_P2  : -5.11690e-06 ± 2.70089e-06
  CSA_Chi2/NDF : 1.56115e-04 / 2
  CSA_P0  : 5.93441e-02 ± 8.33384e-03
  CSA_P1  : 1.00161e-02 ± 6.27895e-04
  CSA_P2  : -4.77145e-05 ± 9.56209e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [2, 72]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 4, 20, 25, 60, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3075', '1.800', '0.1274', '1.800', '0.0901', '7.000', '0.7080', 1, 1, 1, 1, 1726211518.50506]
VI_after__Init : ['1.202', '0.3075', '1.800', '0.1274', '1.800', '0.0849', '7.000', '0.7080', 1, 1, 1, 1, 1726211526.7474167]
VI_at__the_End : ['1.202', '0.4941', '1.800', '0.1392', '1.800', '0.1131', '7.000', '0.7085', 1, 1, 1, 1, 1726211585.836673]