TEST_NAME : Wafer
TEST_DATE : 24_09_13-09_24_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-004-023-12 | FUSED_ID : 6359364768400163196
  IC_TEMP :  -57.47 | VDDM : 1114.13 | AUX_INT : -118.61 | CsaBias :  -18.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15232e-03 / 2
  ADC_P0  : -1.18610e-01 ± 2.82933e-02
  ADC_P1  : 1.01121e-02 ± 6.69309e-04
  ADC_P2  : -1.17425e-05 ± 3.11960e-06
  CSA_Chi2/NDF : 1.27578e-04 / 2
  CSA_P0  : 5.86518e-02 ± 7.53373e-03
  CSA_P1  : 9.75445e-03 ± 5.67612e-04
  CSA_P2  : -4.48983e-05 ± 8.64406e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [17, 75, 92, 118, 120, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [20, 61, 90, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3882', '1.800', '0.1272', '1.800', '0.0894', '7.000', '0.7079', 1, 1, 1, 1, 1726212294.5074556]
VI_after__Init : ['1.202', '0.3885', '1.800', '0.1272', '1.800', '0.0835', '7.000', '0.7081', 1, 1, 1, 1, 1726212303.3447168]
VI_at__the_End : ['1.202', '0.4910', '1.800', '0.1363', '1.800', '0.1135', '7.000', '0.7086', 1, 1, 1, 1, 1726212370.745411]