TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_00_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-005-004-06 | FUSED_ID : 6359364768400166982
  IC_TEMP :  -58.75 | VDDM : 1112.97 | AUX_INT :   -7.23 | CsaBias :   69.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26789e-03 / 2
  ADC_P0  : -7.23235e-03 ± 2.41357e-02
  ADC_P1  : 8.54859e-03 ± 6.06186e-04
  ADC_P2  : -5.99998e-06 ± 3.01703e-06
  CSA_Chi2/NDF : 1.59915e-04 / 2
  CSA_P0  : 5.65941e-02 ± 8.43466e-03
  CSA_P1  : 9.86229e-03 ± 6.35491e-04
  CSA_P2  : -4.72626e-05 ± 9.67777e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [23, 63, 64]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [7, 15, 43, 65, 71, 73, 89, 92, 93, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3438', '1.800', '0.1112', '1.800', '0.0844', '7.000', '0.7084', 1, 1, 1, 1, 1726214431.278527]
VI_after__Init : ['1.202', '0.3440', '1.800', '0.1113', '1.800', '0.0793', '7.000', '0.7079', 1, 1, 1, 1, 1726214439.4580073]
VI_at__the_End : ['1.202', '0.4860', '1.800', '0.1408', '1.800', '0.1134', '7.000', '0.7089', 1, 1, 1, 1, 1726214499.8714101]