TEST_NAME : Wafer
TEST_DATE : 24_09_13-09_29_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-005-023-01 | FUSED_ID : 6359364768400167281
  IC_TEMP :  -56.32 | VDDM : 1125.39 | AUX_INT :   -6.96 | CsaBias :   77.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07542e-03 / 2
  ADC_P0  : -6.95714e-03 ± 2.21941e-02
  ADC_P1  : 8.51604e-03 ± 5.52435e-04
  ADC_P2  : -6.15043e-06 ± 2.72363e-06
  CSA_Chi2/NDF : 1.23518e-04 / 2
  CSA_P0  : 5.82923e-02 ± 7.41290e-03
  CSA_P1  : 9.75107e-03 ± 5.58509e-04
  CSA_P2  : -4.46950e-05 ± 8.50542e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [18, 32, 33, 52, 67, 79, 90, 103, 114, 120, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 12, 14, 17, 22, 113, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1337', '1.800', '0.1668', '1.800', '0.0811', '7.000', '0.7079', 1, 1, 1, 1, 1726212586.3748662]
VI_after__Init : ['1.202', '0.1336', '1.800', '0.1666', '1.800', '0.0755', '7.000', '0.7082', 1, 1, 1, 1, 1726212594.439236]
VI_at__the_End : ['1.202', '0.4922', '1.800', '0.1389', '1.800', '0.1122', '7.000', '0.7087', 1, 1, 1, 1, 1726212654.219563]