TEST_NAME : Wafer
TEST_DATE : 24_09_13-09_28_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-005-024-01 | FUSED_ID : 6359364768400167297
  IC_TEMP :  -55.65 | VDDM : 1117.20 | AUX_INT :   -6.31 | CsaBias :   83.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.03988e-04 / 2
  ADC_P0  : -6.30525e-03 ± 2.03878e-02
  ADC_P1  : 8.23981e-03 ± 5.05200e-04
  ADC_P2  : -4.99834e-06 ± 2.47500e-06
  CSA_Chi2/NDF : 1.44421e-04 / 2
  CSA_P0  : 5.58422e-02 ± 8.01564e-03
  CSA_P1  : 9.51213e-03 ± 6.03921e-04
  CSA_P2  : -4.25048e-05 ± 9.19700e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [39, 76, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [7, 24, 41, 89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4407', '1.800', '0.1431', '1.800', '0.0934', '7.000', '0.7082', 1, 1, 1, 1, 1726212489.2453866]
VI_after__Init : ['1.202', '0.4416', '1.800', '0.1433', '1.800', '0.0876', '7.000', '0.7081', 1, 1, 1, 1, 1726212497.337735]
VI_at__the_End : ['1.202', '0.4822', '1.800', '0.1373', '1.800', '0.1156', '7.000', '0.7089', 1, 1, 1, 1, 1726212557.2450075]