TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_32_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-006-022-15 | FUSED_ID : 6359364768400171375
  IC_TEMP :  -48.69 | VDDM : 1129.66 | AUX_INT :   -6.25 | CsaBias :   81.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.39452e-04 / 2
  ADC_P0  : -6.24799e-03 ± 2.07541e-02
  ADC_P1  : 7.99167e-03 ± 4.91196e-04
  ADC_P2  : -5.07849e-06 ± 2.30231e-06
  CSA_Chi2/NDF : 8.47797e-05 / 2
  CSA_P0  : 5.63464e-02 ± 6.14141e-03
  CSA_P1  : 9.58436e-03 ± 4.62711e-04
  CSA_P2  : -4.17511e-05 ± 7.04654e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [33, 77, 98, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [8, 26, 36, 37, 44, 75, 93, 103, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1992', '1.800', '0.1631', '1.800', '0.0853', '7.000', '0.7080', 1, 1, 1, 1, 1726216376.0076313]
VI_after__Init : ['1.202', '0.1992', '1.800', '0.1630', '1.800', '0.0799', '7.000', '0.7081', 1, 1, 1, 1, 1726216384.863898]
VI_at__the_End : ['1.202', '0.4908', '1.800', '0.1360', '1.799', '0.1111', '6.999', '0.7086', 1, 1, 1, 1, 1726216445.2221982]