TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_16_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-007-004-05 | FUSED_ID : 6359364768400175173
  IC_TEMP :  -55.09 | VDDM : 1123.61 | AUX_INT :   -5.45 | CsaBias :   63.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.98188e-04 / 2
  ADC_P0  : -5.45313e-03 ± 1.78522e-02
  ADC_P1  : 8.71208e-03 ± 4.57827e-04
  ADC_P2  : -6.38230e-06 ± 2.31930e-06
  CSA_Chi2/NDF : 1.58453e-04 / 2
  CSA_P0  : 5.76717e-02 ± 8.39599e-03
  CSA_P1  : 9.95379e-03 ± 6.32577e-04
  CSA_P2  : -4.63671e-05 ± 9.63340e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [26, 28, 64, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 41, 75, 89, 95, 99, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4340', '1.800', '0.1410', '1.800', '0.0966', '7.000', '0.7082', 1, 1, 1, 1, 1726218993.6762347]
VI_after__Init : ['1.202', '0.4342', '1.800', '0.1410', '1.800', '0.0911', '7.000', '0.7080', 1, 1, 1, 1, 1726219001.7237318]
VI_at__the_End : ['1.202', '0.4964', '1.800', '0.1417', '1.800', '0.1124', '7.000', '0.7089', 1, 1, 1, 1, 1726219067.8904967]