TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_11_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-007-007-05 | FUSED_ID : 6359364768400175221
  IC_TEMP :  -53.60 | VDDM : 1121.91 | AUX_INT :   -8.88 | CsaBias :   89.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48316e-03 / 2
  ADC_P0  : -8.87738e-03 ± 2.61247e-02
  ADC_P1  : 8.29087e-03 ± 6.35102e-04
  ADC_P2  : -5.60168e-06 ± 3.06369e-06
  CSA_Chi2/NDF : 1.53927e-04 / 2
  CSA_P0  : 5.67250e-02 ± 8.27523e-03
  CSA_P1  : 1.01613e-02 ± 6.23479e-04
  CSA_P2  : -4.97906e-05 ± 9.49485e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [45, 54, 81, 86, 96, 99, 116, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [54, 100, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2949', '1.800', '0.1262', '1.800', '0.0878', '6.999', '0.7093', 1, 1, 1, 1, 1726218701.8250165]
VI_after__Init : ['1.202', '0.2949', '1.800', '0.1262', '1.800', '0.0803', '7.000', '0.7084', 1, 1, 1, 1, 1726218709.9783835]
VI_at__the_End : ['1.202', '0.4959', '1.800', '0.1396', '1.800', '0.1118', '6.999', '0.7091', 1, 1, 1, 1, 1726218770.6655433]