TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_02_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-007-013-05 | FUSED_ID : 6359364768400175317
  IC_TEMP :  -54.25 | VDDM : 1130.18 | AUX_INT :   -7.36 | CsaBias :   82.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26816e-03 / 2
  ADC_P0  : -7.35800e-03 ± 2.41139e-02
  ADC_P1  : 8.26340e-03 ± 5.79318e-04
  ADC_P2  : -5.96418e-06 ± 2.75396e-06
  CSA_Chi2/NDF : 1.24225e-04 / 2
  CSA_P0  : 5.75877e-02 ± 7.43406e-03
  CSA_P1  : 9.78164e-03 ± 5.60103e-04
  CSA_P2  : -4.37468e-05 ± 8.52970e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [6, 42, 84, 100, 104, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [44, 79, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2858', '1.800', '0.1436', '1.800', '0.0925', '7.000', '0.7089', 1, 1, 1, 1, 1726218126.1420717]
VI_after__Init : ['1.202', '0.2858', '1.800', '0.1436', '1.800', '0.0851', '7.000', '0.7079', 1, 1, 1, 1, 1726218134.233396]
VI_at__the_End : ['1.202', '0.4937', '1.800', '0.1389', '1.800', '0.1113', '7.000', '0.7087', 1, 1, 1, 1, 1726218201.8951833]