TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_57_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-007-016-02 | FUSED_ID : 6359364768400175362
  IC_TEMP :  -50.95 | VDDM : 1130.84 | AUX_INT :   -6.51 | CsaBias :   89.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11407e-03 / 2
  ADC_P0  : -6.51133e-03 ± 2.26337e-02
  ADC_P1  : 8.01979e-03 ± 5.40255e-04
  ADC_P2  : -4.93960e-06 ± 2.55507e-06
  CSA_Chi2/NDF : 9.48254e-05 / 2
  CSA_P0  : 5.74076e-02 ± 6.49508e-03
  CSA_P1  : 9.59834e-03 ± 4.89358e-04
  CSA_P2  : -4.10399e-05 ± 7.45234e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [22, 57, 60, 63, 65, 72, 102, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [9, 46, 54, 72, 108, 111, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3366', '1.800', '0.1697', '1.800', '0.0941', '7.000', '0.7081', 1, 1, 1, 1, 1726217835.0421562]
VI_after__Init : ['1.202', '0.3367', '1.800', '0.1697', '1.800', '0.0887', '7.000', '0.7079', 1, 1, 1, 1, 1726217842.9945195]
VI_at__the_End : ['1.202', '0.4957', '1.800', '0.1384', '1.800', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1726217908.3553214]