TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_45_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-007-023-02 | FUSED_ID : 6359364768400175474
  IC_TEMP :  -49.21 | VDDM : 1126.45 | AUX_INT :   -8.15 | CsaBias :   73.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05598e-03 / 2
  ADC_P0  : -8.14679e-03 ± 2.19783e-02
  ADC_P1  : 8.23614e-03 ± 5.25106e-04
  ADC_P2  : -5.91064e-06 ± 2.48720e-06
  CSA_Chi2/NDF : 1.29418e-04 / 2
  CSA_P0  : 5.79845e-02 ± 7.58785e-03
  CSA_P1  : 9.85439e-03 ± 5.71690e-04
  CSA_P2  : -4.42964e-05 ± 8.70616e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [1, 5, 15, 36, 61, 65, 100, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [30, 34, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1125', '1.800', '0.1576', '1.800', '0.0865', '7.000', '0.7079', 1, 1, 1, 1, 1726217154.0206134]
VI_after__Init : ['1.202', '0.1124', '1.800', '0.1575', '1.800', '0.0808', '7.000', '0.7081', 1, 1, 1, 1, 1726217162.8429575]
VI_at__the_End : ['1.202', '0.4991', '1.800', '0.1364', '1.800', '0.1099', '7.000', '0.7089', 1, 1, 1, 1, 1726217231.2466953]