TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_44_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-007-024-02 | FUSED_ID : 6359364768400175490
  IC_TEMP :  -50.85 | VDDM : 1125.73 | AUX_INT :   -7.88 | CsaBias :   82.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41347e-03 / 2
  ADC_P0  : -7.87826e-03 ± 2.55112e-02
  ADC_P1  : 8.26564e-03 ± 6.22185e-04
  ADC_P2  : -5.31381e-06 ± 3.01815e-06
  CSA_Chi2/NDF : 1.45272e-04 / 2
  CSA_P0  : 5.83293e-02 ± 8.03921e-03
  CSA_P1  : 9.98272e-03 ± 6.05696e-04
  CSA_P2  : -4.63655e-05 ± 9.22403e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 19, 47, 69, 88, 119, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [10, 99, 104, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4652', '1.800', '0.1807', '1.800', '0.0944', '7.000', '0.7082', 1, 1, 1, 1, 1726217057.3540654]
VI_after__Init : ['1.202', '0.4645', '1.800', '0.1808', '1.800', '0.0887', '7.000', '0.7080', 1, 1, 1, 1, 1726217065.4222996]
VI_at__the_End : ['1.202', '0.5000', '1.800', '0.1384', '1.800', '0.1113', '7.000', '0.7086', 1, 1, 1, 1, 1726217126.1167831]