TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_41_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-007-026-02 | FUSED_ID : 6359364768400175522
  IC_TEMP :  -57.65 | VDDM : 1130.50 | AUX_INT :   -6.52 | CsaBias :   70.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.12864e-04 / 2
  ADC_P0  : -6.52015e-03 ± 2.04228e-02
  ADC_P1  : 8.63821e-03 ± 5.14491e-04
  ADC_P2  : -6.45711e-06 ± 2.56481e-06
  CSA_Chi2/NDF : 1.78511e-04 / 2
  CSA_P0  : 5.85958e-02 ± 8.91159e-03
  CSA_P1  : 9.66133e-03 ± 6.71424e-04
  CSA_P2  : -4.42116e-05 ± 1.02250e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [11, 24, 25, 28, 50, 58, 61, 70, 75, 98]
 | N_BROKEN_SLOW :  [0, 1, 18, 21, 36, 46]
   P_BROKEN_DISC :  42
 | P_BROKEN_FAST :  [0, 1, 2, 3, 7, 72, 76, 86]
 | P_BROKEN_SLOW :  [0, 1, 2, 3, 4, 5, 6, 7, 9, 11, 12, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3629', '1.800', '0.1333', '1.800', '0.0933', '7.000', '0.7080', 1, 1, 1, 1, 1726216862.8489885]
VI_after__Init : ['1.202', '0.3632', '1.800', '0.1334', '1.800', '0.0876', '7.000', '0.7079', 1, 1, 1, 1, 1726216870.9773197]
VI_at__the_End : ['1.202', '0.4891', '1.800', '0.1398', '1.800', '0.1114', '7.000', '0.7087', 1, 1, 1, 1, 1726216938.2590327]