TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_31_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-009-01 | FUSED_ID : 6359364768400179345
  IC_TEMP :  -51.96 | VDDM : 1129.07 | AUX_INT :   -7.08 | CsaBias :   82.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08332e-03 / 2
  ADC_P0  : -7.08400e-03 ± 2.22542e-02
  ADC_P1  : 8.23191e-03 ± 5.30051e-04
  ADC_P2  : -6.08271e-06 ± 2.49708e-06
  CSA_Chi2/NDF : 9.75532e-05 / 2
  CSA_P0  : 5.74442e-02 ± 6.58784e-03
  CSA_P1  : 9.34456e-03 ± 4.96346e-04
  CSA_P2  : -3.91772e-05 ± 7.55877e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [10, 29, 70, 93, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [36, 93, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2079', '1.800', '0.1762', '1.800', '0.0912', '7.000', '0.7083', 1, 1, 1, 1, 1726219868.7422879]
VI_after__Init : ['1.202', '0.2080', '1.800', '0.1760', '1.800', '0.0858', '7.000', '0.7081', 1, 1, 1, 1, 1726219876.86671]
VI_at__the_End : ['1.202', '0.4852', '1.800', '0.1370', '1.800', '0.1127', '7.000', '0.7090', 1, 1, 1, 1, 1726219940.223936]