TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_39_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-014-01 | FUSED_ID : 6359364768400179425
  IC_TEMP :  -48.07 | VDDM : 1131.50 | AUX_INT :  -34.99 | CsaBias :   52.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32806e-03 / 2
  ADC_P0  : -3.49868e-02 ± 2.61225e-02
  ADC_P1  : 8.81392e-03 ± 6.48396e-04
  ADC_P2  : -6.61180e-06 ± 3.18591e-06
  CSA_Chi2/NDF : 1.18086e-04 / 2
  CSA_P0  : 5.85362e-02 ± 7.24806e-03
  CSA_P1  : 9.89168e-03 ± 5.46089e-04
  CSA_P2  : -4.52480e-05 ± 8.31628e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [25, 37, 45, 51, 62, 71, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [8, 24, 89, 107, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2791', '1.800', '0.1509', '1.800', '0.0838', '7.000', '0.7081', 1, 1, 1, 1, 1726220353.478815]
VI_after__Init : ['1.202', '0.2792', '1.800', '0.1508', '1.800', '0.0785', '7.000', '0.7083', 1, 1, 1, 1, 1726220361.7321866]
VI_at__the_End : ['1.202', '0.4982', '1.800', '0.1404', '1.800', '0.1110', '7.000', '0.7091', 1, 1, 1, 1, 1726220425.1502767]