TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_45_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-018-06 | FUSED_ID : 6359364768400179494
  IC_TEMP :  -52.53 | VDDM : 1125.49 | AUX_INT :   -4.99 | CsaBias :   60.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.83339e-04 / 2
  ADC_P0  : -4.98954e-03 ± 1.89441e-02
  ADC_P1  : 8.20933e-03 ± 4.63792e-04
  ADC_P2  : -5.36327e-06 ± 2.23870e-06
  CSA_Chi2/NDF : 1.28337e-04 / 2
  CSA_P0  : 5.99392e-02 ± 7.55610e-03
  CSA_P1  : 1.00531e-02 ± 5.69298e-04
  CSA_P2  : -4.81716e-05 ± 8.66973e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [11, 47, 77, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [20, 37, 59, 62, 87, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1254', '1.800', '0.1436', '1.800', '0.0833', '7.000', '0.7083', 1, 1, 1, 1, 1726220742.4517426]
VI_after__Init : ['1.202', '0.1254', '1.800', '0.1432', '1.800', '0.0777', '7.000', '0.7083', 1, 1, 1, 1, 1726220751.2550561]
VI_at__the_End : ['1.199', '0.4954', '1.800', '0.1404', '1.800', '0.1122', '7.000', '0.7090', 1, 1, 1, 1, 1726220813.9871857]