TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_48_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-020-06 | FUSED_ID : 6359364768400179526
  IC_TEMP :  -54.06 | VDDM : 1135.63 | AUX_INT :   -5.99 | CsaBias :   68.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.53807e-04 / 2
  ADC_P0  : -5.98535e-03 ± 1.72728e-02
  ADC_P1  : 8.38522e-03 ± 4.25609e-04
  ADC_P2  : -6.03693e-06 ± 2.06729e-06
  CSA_Chi2/NDF : 1.18277e-04 / 2
  CSA_P0  : 6.01340e-02 ± 7.25392e-03
  CSA_P1  : 9.96728e-03 ± 5.46531e-04
  CSA_P2  : -4.52624e-05 ± 8.32302e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [6, 11, 34, 48, 76, 100, 117, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [15, 46, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2818', '1.800', '0.1716', '1.800', '0.0936', '7.000', '0.7079', 1, 1, 1, 1, 1726220936.9646559]
VI_after__Init : ['1.202', '0.2823', '1.800', '0.1716', '1.800', '0.0884', '7.000', '0.7080', 1, 1, 1, 1, 1726220945.2060025]
VI_at__the_End : ['1.202', '0.5032', '1.800', '0.1412', '1.800', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1726221005.6922827]