TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_53_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-023-06 | FUSED_ID : 6359364768400179574
  IC_TEMP :  -52.27 | VDDM : 1133.93 | AUX_INT :   -4.61 | CsaBias :   83.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.45713e-04 / 2
  ADC_P0  : -4.60718e-03 ± 1.84912e-02
  ADC_P1  : 8.02476e-03 ± 4.45936e-04
  ADC_P2  : -4.92302e-06 ± 2.11981e-06
  CSA_Chi2/NDF : 9.92838e-05 / 2
  CSA_P0  : 5.87023e-02 ± 6.64602e-03
  CSA_P1  : 9.46640e-03 ± 5.00729e-04
  CSA_P2  : -3.95827e-05 ± 7.62552e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [19, 25, 46, 98, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 27, 30, 71, 72, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3337', '1.800', '0.1629', '1.800', '0.0875', '7.002', '0.7078', 1, 1, 1, 1, 1726221229.0509868]
VI_after__Init : ['1.202', '0.3337', '1.800', '0.1630', '1.800', '0.0817', '7.002', '0.7079', 1, 1, 1, 1, 1726221237.0004444]
VI_at__the_End : ['1.202', '0.4927', '1.800', '0.1363', '1.800', '0.1104', '7.000', '0.7086', 1, 1, 1, 1, 1726221300.3224993]