TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_57_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-025-06 | FUSED_ID : 6359364768400179606
  IC_TEMP :  -55.04 | VDDM : 1135.06 | AUX_INT : -126.21 | CsaBias :  -14.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.14892e-04 / 2
  ADC_P0  : -1.26208e-01 ± 2.10672e-02
  ADC_P1  : 1.03057e-02 ± 5.00466e-04
  ADC_P2  : -1.26483e-05 ± 2.32376e-06
  CSA_Chi2/NDF : 1.51530e-04 / 2
  CSA_P0  : 5.86109e-02 ± 8.21054e-03
  CSA_P1  : 9.87502e-03 ± 6.18605e-04
  CSA_P2  : -4.40199e-05 ± 9.42062e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [21, 48, 55, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [35, 61, 120, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3031', '1.800', '0.1651', '1.800', '0.0934', '6.999', '0.7077', 1, 1, 1, 1, 1726221423.4949694]
VI_after__Init : ['1.202', '0.3033', '1.800', '0.1650', '1.800', '0.0877', '6.999', '0.7075', 1, 1, 1, 1, 1726221432.2902918]
VI_at__the_End : ['1.202', '0.5018', '1.800', '0.1405', '1.800', '0.1106', '7.000', '0.7083', 1, 1, 1, 1, 1726221491.2387326]