TEST_NAME : Wafer
TEST_DATE : 24_09_13-12_48_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-010-005-02 | FUSED_ID : 6359364768400187474
  IC_TEMP :  -47.53 | VDDM : 1124.83 | AUX_INT :   -6.65 | CsaBias :   87.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10092e-03 / 2
  ADC_P0  : -6.64919e-03 ± 2.24920e-02
  ADC_P1  : 7.88628e-03 ± 5.26336e-04
  ADC_P2  : -4.84325e-06 ± 2.44143e-06
  CSA_Chi2/NDF : 7.05181e-05 / 2
  CSA_P0  : 5.88073e-02 ± 5.60109e-03
  CSA_P1  : 9.18452e-03 ± 4.22002e-04
  CSA_P2  : -3.57970e-05 ± 6.42659e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [7, 21, 25, 35, 41, 50, 104, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [17, 24, 34, 62, 76, 83, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2069', '1.800', '0.1112', '1.800', '0.0853', '7.000', '0.7086', 1, 1, 1, 1, 1726224535.9654963]
VI_after__Init : ['1.202', '0.2069', '1.800', '0.1112', '1.800', '0.0779', '7.000', '0.7077', 1, 1, 1, 1, 1726224544.7628682]
VI_at__the_End : ['1.202', '0.4924', '1.800', '0.1389', '1.800', '0.1098', '7.000', '0.7085', 1, 1, 1, 1, 1726224610.95687]