TEST_NAME : Wafer
TEST_DATE : 24_09_13-12_56_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-010-010-02 | FUSED_ID : 6359364768400187554
  IC_TEMP :  -47.49 | VDDM : 1130.64 | AUX_INT :   -7.29 | CsaBias :   90.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11523e-03 / 2
  ADC_P0  : -7.29059e-03 ± 2.26537e-02
  ADC_P1  : 8.17432e-03 ± 5.51773e-04
  ADC_P2  : -5.09859e-06 ± 2.66166e-06
  CSA_Chi2/NDF : 7.92968e-05 / 2
  CSA_P0  : 5.90311e-02 ± 5.93950e-03
  CSA_P1  : 9.55323e-03 ± 4.47499e-04
  CSA_P2  : -4.02779e-05 ± 6.81488e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [26, 36, 87, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [5, 47, 57, 63, 70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3065', '1.800', '0.1603', '1.800', '0.0887', '7.005', '0.7072', 1, 1, 1, 1, 1726225014.7276807]
VI_after__Init : ['1.202', '0.3064', '1.800', '0.1588', '1.802', '0.0834', '6.999', '0.7077', 1, 1, 1, 1, 1726225022.9300168]
VI_at__the_End : ['1.202', '0.4966', '1.800', '0.1401', '1.800', '0.1105', '7.000', '0.7086', 1, 1, 1, 1, 1726225083.6663172]