TEST_NAME : Wafer
TEST_DATE : 24_09_13-12_58_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-010-011-02 | FUSED_ID : 6359364768400187570
  IC_TEMP :  -56.67 | VDDM : 1130.15 | AUX_INT :   -7.41 | CsaBias :   79.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15121e-03 / 2
  ADC_P0  : -7.40736e-03 ± 2.29526e-02
  ADC_P1  : 8.72265e-03 ± 5.80259e-04
  ADC_P2  : -6.69506e-06 ± 2.90643e-06
  CSA_Chi2/NDF : 1.39360e-04 / 2
  CSA_P0  : 6.12258e-02 ± 7.87392e-03
  CSA_P1  : 1.03608e-02 ± 5.93243e-04
  CSA_P2  : -5.21783e-05 ± 9.03439e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [1, 41, 44, 50, 51, 80, 83, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [14, 35, 88, 104, 114, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2802', '1.800', '0.1418', '1.799', '0.0850', '7.000', '0.7078', 1, 1, 1, 1, 1726225112.28727]
VI_after__Init : ['1.202', '0.2802', '1.800', '0.1418', '1.801', '0.0796', '7.000', '0.7077', 1, 1, 1, 1, 1726225120.418659]
VI_at__the_End : ['1.202', '0.5026', '1.800', '0.1439', '1.800', '0.1125', '7.000', '0.7086', 1, 1, 1, 1, 1726225181.718018]