TEST_NAME : Wafer
TEST_DATE : 24_09_13-13_01_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-010-013-02 | FUSED_ID : 6359364768400187602
  IC_TEMP :  -51.07 | VDDM : 1128.47 | AUX_INT :   -8.71 | CsaBias :   83.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32392e-03 / 2
  ADC_P0  : -8.70641e-03 ± 2.46280e-02
  ADC_P1  : 8.47308e-03 ± 6.00627e-04
  ADC_P2  : -6.52400e-06 ± 2.89917e-06
  CSA_Chi2/NDF : 8.80968e-05 / 2
  CSA_P0  : 5.96628e-02 ± 6.26041e-03
  CSA_P1  : 9.73900e-03 ± 4.71676e-04
  CSA_P2  : -4.21045e-05 ± 7.18307e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 52, 53, 55, 74, 75, 87]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [24, 54]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2047', '1.800', '0.1828', '1.800', '0.0823', '7.000', '0.7079', 1, 1, 1, 1, 1726225306.7556515]
VI_after__Init : ['1.202', '0.2047', '1.800', '0.1829', '1.800', '0.0770', '7.000', '0.7079', 1, 1, 1, 1, 1726225314.7449424]
VI_at__the_End : ['1.202', '0.5017', '1.800', '0.1394', '1.800', '0.1096', '7.000', '0.7086', 1, 1, 1, 1, 1726225381.7029417]